Semiconductor device and method of forming an inductor on polymer matrix composite substrate

ABSTRACT

A semiconductor device has a first insulating layer formed over a first surface of a polymer matrix composite substrate. A first conductive layer is formed over the first insulating layer. A second insulating layer is formed over the first insulating layer and first conductive layer. A second conductive layer is formed over the second insulating layer and first conductive layer. The second conductive layer is wound to exhibit inductive properties. A third conductive layer is formed between the first conductive layer and second conductive layer. A third insulating layer is formed over the second insulating layer and second conductive layer. A bump is formed over the second conductive layer. A fourth insulating layer can be formed over a second surface of the polymer matrix composite substrate. Alternatively, the fourth insulating layer can be formed over the first insulating layer prior to forming the first conductive layer.

CLAIM TO DOMESTIC PRIORITY

The present application is a division of U.S. patent application Ser.No. 12/726,880, now U.S. Pat. No. 8,791,006, filed Mar. 18, 2010, whichis a continuation-in-part of U.S. patent application Ser. No.12/621,738, now U.S. Pat. No. 8,158,510, filed Nov. 19, 2009. U.S.patent application Ser. No. 12/726,880 is further a continuation-in-partof U.S. patent application Ser. No. 11/949,255, now U.S. Pat. No.8,409,970, filed Dec. 3, 2007, which is a continuation-in-part of U.S.application Ser. No. 11/553,949, now U.S. Pat. No. 8,669,637, filed Oct.27, 2006, which claims the benefit of U.S. Provisional Application No.60/596,926, filed Oct. 29, 2005. All the above applications areincorporated herein by reference.

FIELD OF THE INVENTION

The present invention relates in general to semiconductor devices and,more particularly, to a semiconductor device and method of forming aninductor over a polymer matrix composite substrate.

BACKGROUND OF THE INVENTION

Semiconductor devices are commonly found in modern electronic products.Semiconductor devices vary in the number and density of electricalcomponents. Discrete semiconductor devices generally contain one type ofelectrical component, e.g., light emitting diode (LED), small signaltransistor, resistor, capacitor, inductor, and power metal oxidesemiconductor field effect transistor (MOSFET). Integrated semiconductordevices typically contain hundreds to millions of electrical components.Examples of integrated semiconductor devices include microcontrollers,microprocessors, charged-coupled devices (CCDs), solar cells, anddigital micro-mirror devices (DMDs).

Semiconductor devices perform a wide range of functions such ashigh-speed calculations, transmitting and receiving electromagneticsignals, controlling electronic devices, transforming sunlight toelectricity, and creating visual projections for television displays.Semiconductor devices are found in the fields of entertainment,communications, power conversion, networks, computers, and consumerproducts. Semiconductor devices are also found in military applications,aviation, automotive, industrial controllers, and office equipment.

Semiconductor devices exploit the electrical properties of semiconductormaterials. The atomic structure of semiconductor material allows itselectrical conductivity to be manipulated by the application of anelectric field or base current or through the process of doping. Dopingintroduces impurities into the semiconductor material to manipulate andcontrol the conductivity of the semiconductor device.

A semiconductor device contains active and passive electricalstructures. Active structures, including bipolar and field effecttransistors, control the flow of electrical current. By varying levelsof doping and application of an electric field or base current, thetransistor either promotes or restricts the flow of electrical current.Passive structures, including resistors, capacitors, and inductors,create a relationship between voltage and current necessary to perform avariety of electrical functions. The passive and active structures areelectrically connected to form circuits, which enable the semiconductordevice to perform high-speed calculations and other useful functions.

Semiconductor devices are generally manufactured using two complexmanufacturing processes, i.e., front-end manufacturing, and back-endmanufacturing, each involving potentially hundreds of steps. Front-endmanufacturing involves the formation of a plurality of die on thesurface of a semiconductor wafer. Each die is typically identical andcontains circuits formed by electrically connecting active and passivecomponents. Back-end manufacturing involves singulating individual diefrom the finished wafer and packaging the die to provide structuralsupport and environmental isolation.

One goal of semiconductor manufacturing is to produce smallersemiconductor devices. Smaller devices typically consume less power,have higher performance, and can be produced more efficiently. Inaddition, smaller semiconductor devices have a smaller footprint, whichis desirable for smaller end products. A smaller die size may beachieved by improvements in the front-end process resulting in die withsmaller, higher density active and passive components. Back-endprocesses may result in semiconductor device packages with a smallerfootprint by improvements in electrical interconnection and packagingmaterials.

Another goal of semiconductor manufacturing is to produce higherperformance semiconductor devices. In high frequency applications, suchas radio frequency (RF) wireless communications, integrated passivedevices (IPDs) are often contained within the semiconductor device.Examples of IPDs include resistors, capacitors, and inductors. A typicalRF system requires multiple IPDs in one or more semiconductor packagesto perform the necessary electrical functions. The inductor is commonlyformed over a sacrificial substrate for structural support. Thesacrificial substrate is removed by a grinding or etching process afterformation of the inductor. The use of the sacrificial substrate addsprocessing steps, such as grinding and etching, as well as cost to themanufacturing process.

SUMMARY OF THE INVENTION

A need exists to simplify the manufacturing process and reduce cost informing an inductor. Accordingly, in one embodiment, the presentinvention is a semiconductor device comprising a polymer matrixcomposite substrate and first insulating layer formed over the polymermatrix composite substrate. An inductor is formed over the firstinsulating layer. An interconnect structure is formed over the firstinsulating layer.

In another embodiment, the present invention is a semiconductor devicecomprising a polymer matrix composite substrate and first insulatinglayer formed over the polymer matrix composite substrate. An integratedpassive device is formed over the first insulating layer. Aninterconnect structure is formed over the first insulating layer.

In another embodiment, the present invention is a semiconductor devicecomprising a polymer matrix composite substrate and integrated passivedevice formed over the polymer matrix composite substrate. Aninterconnect structure is formed over the integrated passive device.

In another embodiment, the present invention is a semiconductor devicecomprising a polymer matrix composite substrate and integrated passivedevice formed over the polymer matrix composite substrate.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates a PCB with different types of packages mounted to itssurface;

FIGS. 2a-2c illustrate further detail of the representativesemiconductor packages mounted to the PCB;

FIGS. 3a-3i illustrate a process of forming an IPD over a polymer matrixcomposite substrate;

FIGS. 4a-4e illustrate another process of forming an IPD over a planarsurface of a polymer matrix composite substrate;

FIG. 5 illustrates another polymer matrix composite substrate with anIPD formed over a planar surface;

FIG. 6 illustrates a conductor wound to form an inductor; and

FIGS. 7a-7n illustrate a process of forming an inductor over a polymermatrix composite substrate.

DETAILED DESCRIPTION OF THE DRAWINGS

The present invention is described in one or more embodiments in thefollowing description with reference to the figures, in which likenumerals represent the same or similar elements. While the invention isdescribed in terms of the best mode for achieving the invention'sobjectives, it will be appreciated by those skilled in the art that itis intended to cover alternatives, modifications, and equivalents as maybe included within the spirit and scope of the invention as defined bythe appended claims and their equivalents as supported by the followingdisclosure and drawings.

Semiconductor devices are generally manufactured using two complexmanufacturing processes: front-end manufacturing and back-endmanufacturing. Front-end manufacturing involves the formation of aplurality of die on the surface of a semiconductor wafer. Each die onthe wafer contains active and passive electrical components, which areelectrically connected to form functional electrical circuits. Activeelectrical components, such as transistors and diodes, have the abilityto control the flow of electrical current. Passive electricalcomponents, such as capacitors, inductors, resistors, and transformers,create a relationship between voltage and current necessary to performelectrical circuit functions.

Passive and active components are formed over the surface of thesemiconductor wafer by a series of process steps including doping,deposition, photolithography, etching, and planarization. Dopingintroduces impurities into the semiconductor material by techniques suchas ion implantation or thermal diffusion. The doping process modifiesthe electrical conductivity of semiconductor material in active devices,transforming the semiconductor material into an insulator, conductor, ordynamically changing the semiconductor material conductivity in responseto an electric field or base current. Transistors contain regions ofvarying types and degrees of doping arranged as necessary to enable thetransistor to promote or restrict the flow of electrical current uponthe application of the electric field or base current.

Active and passive components are formed by layers of materials withdifferent electrical properties. The layers can be formed by a varietyof deposition techniques determined in part by the type of materialbeing deposited. For example, thin film deposition may involve chemicalvapor deposition (CVD), physical vapor deposition (PVD), electrolyticplating, and electroless plating processes. Each layer is generallypatterned to form portions of active components, passive components, orelectrical connections between components.

The layers can be patterned using photolithography, which involves thedeposition of light sensitive material, e.g., photoresist, over thelayer to be patterned. A pattern is transferred from a photomask to thephotoresist using light. The portion of the photoresist patternsubjected to light is removed using a solvent, exposing portions of theunderlying layer to be patterned. The remainder of the photoresist isremoved, leaving behind a patterned layer. Alternatively, some types ofmaterials are patterned by directly depositing the material into theareas or voids formed by a previous deposition/etch process usingtechniques such as electroless and electrolytic plating.

Depositing a thin film of material over an existing pattern canexaggerate the underlying pattern and create a non-uniformly flatsurface. A uniformly flat surface is required to produce smaller andmore densely packed active and passive components. Planarization can beused to remove material from the surface of the wafer and produce auniformly flat surface. Planarization involves polishing the surface ofthe wafer with a polishing pad. An abrasive material and corrosivechemical are added to the surface of the wafer during polishing. Thecombined mechanical action of the abrasive and corrosive action of thechemical removes any irregular topography, resulting in a uniformly flatsurface.

Back-end manufacturing refers to cutting or singulating the finishedwafer into the individual die and then packaging the die for structuralsupport and environmental isolation. To singulate the die, the wafer isscored and broken along non-functional regions of the wafer called sawstreets or scribes. The wafer is singulated using a laser cutting toolor saw blade. After singulation, the individual die are mounted to apackage substrate that includes pins or contact pads for interconnectionwith other system components. Contact pads formed over the semiconductordie are then connected to contact pads within the package. Theelectrical connections can be made with solder bumps, stud bumps,conductive paste, or wirebonds. An encapsulant or other molding materialis deposited over the package to provide physical support and electricalisolation. The finished package is then inserted into an electricalsystem and the functionality of the semiconductor device is madeavailable to the other system components.

FIG. 1 illustrates electronic device 50 having a chip carrier substrateor printed circuit board (PCB) 52 with a plurality of semiconductorpackages mounted on its surface. Electronic device 50 may have one typeof semiconductor package, or multiple types of semiconductor packages,depending on the application. The different types of semiconductorpackages are shown in FIG. 1 for purposes of illustration.

Electronic device 50 may be a stand-alone system that uses thesemiconductor packages to perform one or more electrical functions.Alternatively, electronic device 50 may be a subcomponent of a largersystem. For example, electronic device 50 may be a graphics card,network interface card, or other signal processing card that can beinserted into a computer. The semiconductor package can includemicroprocessors, memories, application specific integrated circuits(ASIC), logic circuits, analog circuits, RF circuits, discrete devices,or other semiconductor die or electrical components.

In FIG. 1, PCB 52 provides a general substrate for structural supportand electrical interconnect of the semiconductor packages mounted on thePCB. Conductive signal traces 54 are formed over a surface or withinlayers of PCB 52 using evaporation, electrolytic plating, electrolessplating, screen printing, or other suitable metal deposition process.Signal traces 54 provide for electrical communication between each ofthe semiconductor packages, mounted components, and other externalsystem components. Traces 54 also provide power and ground connectionsto each of the semiconductor packages.

In some embodiments, a semiconductor device has two packaging levels.First level packaging is a technique for mechanically and electricallyattaching the semiconductor die to an intermediate carrier. Second levelpackaging involves mechanically and electrically attaching theintermediate carrier to the PCB. In other embodiments, a semiconductordevice may only have the first level packaging where the die ismechanically and electrically mounted directly to the PCB.

For the purpose of illustration, several types of first level packaging,including wire bond package 56 and flip chip 58, are shown on PCB 52.Additionally, several types of second level packaging, including ballgrid array (BGA) 60, bump chip carrier (BCC) 62, dual in-line package(DIP) 64, land grid array (LGA) 66, multi-chip module (MCM) 68, quadflat non-leaded package (QFN) 70, and quad flat package 72, are shownmounted on PCB 52. Depending upon the system requirements, anycombination of semiconductor packages, configured with any combinationof first and second level packaging styles, as well as other electroniccomponents, can be connected to PCB 52. In some embodiments, electronicdevice 50 includes a single attached semiconductor package, while otherembodiments call for multiple interconnected packages. By combining oneor more semiconductor packages over a single substrate, manufacturerscan incorporate pre-made components into electronic devices and systems.Because the semiconductor packages include sophisticated functionality,electronic devices can be manufactured using cheaper components and astreamlined manufacturing process. The resulting devices are less likelyto fail and less expensive to manufacture resulting in a lower cost forconsumers.

FIGS. 2a-2c show exemplary semiconductor packages. FIG. 2a illustratesfurther detail of DIP 64 mounted on PCB 52. Semiconductor die 74includes an active region containing analog or digital circuitsimplemented as active devices, passive devices, conductive layers, anddielectric layers formed within the die and are electricallyinterconnected according to the electrical design of the die. Forexample, the circuit may include one or more transistors, diodes,inductors, capacitors, resistors, and other circuit elements formedwithin the active region of semiconductor die 74. Contact pads 76 areone or more layers of conductive material, such as aluminum (Al), copper(Cu), tin (Sn), nickel (Ni), gold (Au), or silver (Ag), and areelectrically connected to the circuit elements formed withinsemiconductor die 74. During assembly of DIP 64, semiconductor die 74 ismounted to an intermediate carrier 78 using a gold-silicon eutecticlayer or adhesive material such as thermal epoxy or epoxy resin. Thepackage body includes an insulative packaging material such as polymeror ceramic. Conductor leads 80 and wire bonds 82 provide electricalinterconnect between semiconductor die 74 and PCB 52. Encapsulant 84 isdeposited over the package for environmental protection by preventingmoisture and particles from entering the package and contaminating die74 or wire bonds 82.

FIG. 2b illustrates further detail of BCC 62 mounted on PCB 52.Semiconductor die 88 is mounted over carrier 90 using an underfill orepoxy-resin adhesive material 92. Wire bonds 94 provide first levelpackaging interconnect between contact pads 96 and 98. Molding compoundor encapsulant 100 is deposited over semiconductor die 88 and wire bonds94 to provide physical support and electrical isolation for the device.Contact pads 102 are formed over a surface of PCB 52 using a suitablemetal deposition process such as electrolytic plating or electrolessplating to prevent oxidation. Contact pads 102 are electricallyconnected to one or more conductive signal traces 54 in PCB 52. Bumps104 are formed between contact pads 98 of BCC 62 and contact pads 102 ofPCB 52.

In FIG. 2c , semiconductor die 58 is mounted face down to intermediatecarrier 106 with a flip chip style first level packaging. Active region108 of semiconductor die 58 contains analog or digital circuitsimplemented as active devices, passive devices, conductive layers, anddielectric layers formed according to the electrical design of the die.For example, the circuit may include one or more transistors, diodes,inductors, capacitors, resistors, and other circuit elements withinactive region 108. Semiconductor die 58 is electrically and mechanicallyconnected to carrier 106 through bumps 110.

BGA 60 is electrically and mechanically connected to PCB 52 with a BGAstyle second level packaging using bumps 112. Semiconductor die 58 iselectrically connected to conductive signal traces 54 in PCB 52 throughbumps 110, signal lines 114, and bumps 112. A molding compound orencapsulant 116 is deposited over semiconductor die 58 and carrier 106to provide physical support and electrical isolation for the device. Theflip chip semiconductor device provides a short electrical conductionpath from the active devices on semiconductor die 58 to conductiontracks on PCB 52 in order to reduce signal propagation distance, lowercapacitance, and improve overall circuit performance. In anotherembodiment, the semiconductor die 58 can be mechanically andelectrically connected directly to PCB 52 using flip chip style firstlevel packaging without intermediate carrier 106.

FIGS. 3a-3i illustrate, in relation to FIGS. 1 and 2 a-2 c, a process offorming an IPD structure over a polymer matrix composite, for exampleepoxy molding compound (EMC) substrate. In FIG. 3a , a chase mold 120has upper plate 120 a and lower plate 120 b. A releasable tape 122 isapplied to upper plate 120 a of chase mold 120. An optional metalcarrier 124 is mounted to lower plate 120 b. Carrier 124 can also besilicon, polymer, polymer composite, ceramic, glass, glass epoxy,beryllium oxide, tape, or other suitable low-cost, rigid material forstructural support. Carrier 124 can be reusable in the manufacturingprocess. Alternatively, carrier 124 can be only one time usable, such assupporting tape and plastic liner. A releasable tape 126 is applied tocarrier 124. Tape 122 and 126 are releasable by mechanical or thermalpressure. A laminated film 128 is formed over releasable tape 126. Thefilm 128 can be metal, such as Cu and Al, or other electric conductivematerial with optional priming for better adhesion with encapsulant 132.An open area 130 is provided between upper plate 120 a and lower plate120 b to dispense encapsulant material.

In FIG. 3b , an encapsulant material or molding compound 132 isdispensed into area 130, between upper plate 120 a and lower plate 120b, using compressive molding, transfer molding, liquid encapsulantmolding, or other suitable applicator. Encapsulant 132 can be a liquid,granular, or powder form, or sheet form of polymer composite material,such as epoxy resin with filler, epoxy acrylate with filler, or polymerwith proper filler from 40% up to 95% content. When cured and removedfrom mold chase 120, encapsulant 132 forms a polymer matrix compositesubstrate wafer or panel 134 with laminated film 128, as shown in FIG.3c . Alternatively, laminated film 128 can cover the full surface ofsubstrate 134. The polymer matrix composite substrate 134 has highresistivity, low loss tangent, lower dielectric constant, coefficient ofthermal expansion (CTE) matching the overlaying IPD structure, and goodthermal conductivity.

In FIG. 3d , film layer 128 is patterned and etched to provide a firstconductive layer 128 a-128 c, as well as to form an indentation orshallow cavity 136 with surface 138 in polymer matrix compositesubstrate 134. Cavity 136 is optional with film layer 128 fully coveringthe surface of panel 134. The individual portions of conductive layer128 a-128 c can be electrically common or electrically isolateddepending on the connectivity of the individual semiconductor die.

In FIG. 3e , an optional planarization insulating layer 142 can beformed over polymer matrix composite substrate 134 and conductive layer128 as one or more layers of silicon dioxide (SiO2), silicon nitride(Si3N4), silicon oxynitride (SiON), tantalum pentoxide (Ta2O5), aluminumoxide (Al2O3), polyimide, benzocyclobutene (BCB), polybenzoxazoles(PBO), WPR, or other suitable dielectric material, especially polymerphotosensitive dielectric materials. The insulating layer 142 serves toplanarize the surface of polymer matrix composite substrate 134 afterremoving laminated film 128 partially in order to improve step coverageof subsequent deposition and lithography processing steps.Alternatively, insulating layer 142 can be used as dielectric for IPD'scapacitor component, as described below. The remaining IPD structuredescribed in FIG. 3f-3i is shown without optional planarization layer142.

In FIG. 3f , an optional resistive layer 146 is formed over conductivelayer 128 a and surface 138 of substrate 134 using PVD, CVD, or othersuitable deposition process. In one embodiment, resistive layer 146 canbe tantalum silicide (TaxSiy) or other metal silicides, TaN, nickelchromium (NiCr), titanium (Ti), titanium nitride (TiN), titaniumtungsten (TiW), or doped poly-silicon having a resistivity between 5 and100 ohm/sq.

An insulating or dielectric layer 148 is formed over resistive layer 146using patterning with PVD, CVD, printing, sintering, or thermaloxidation. The insulating layer 148 can be one or more layers of SiO2,Si3N4, SiON, Ta2O5, Al2O3, polyimide, BCB, PBO, or other suitabledielectric material. The overlapping between conductive layer 128 a,resistive layer 146, and insulating layer 148 can have other embodiment.For example, resistive layer 146 can be fully inside conductive layer128 a.

In FIG. 3g , an insulating or passivation layer 150 is formed overconductive layer 128, resistive layer 146, and insulating layer 148using spin coating, PVD, CVD, printing, sintering, or thermal oxidation.The insulating layer 150 can be one or more layers of SiO2, Si3N4, SiON,Ta2O5, Al2O3, polyimide, BCB, PBO, WPR, or other material havingsuitable insulating and structural properties, especially polymer photosensitive dielectric materials. A portion of insulating layer 150 isremoved to expose conductive layer 128, resistive layer 146, andinsulating layer 148.

In FIG. 3h , an electrically conductive layer 152 is formed overconductive layer 128, insulating layers 148 and 150, and resistive layer146 using patterning with PVD, CVD, sputtering, electrolytic plating,electroless plating process, or other suitable metal deposition processto form individual portions or sections 152 a-152 j. Conductive layer152 can be one or more layers of Al, Cu, Sn, Ni, Au, Ag, Ti, TiW, orother suitable electrically conductive material. The individual portionsof conductive layer 152 a-152 j can be electrically common orelectrically isolated depending on the connectivity of the individualsemiconductor die.

An insulating or passivation layer 154 is formed over insulating layer150 and conductive layer 152 using spin coating, PVD, CVD, printing,sintering, or thermal oxidation. The insulating layer 154 can be one ormore layers of SiO2, Si3N4, SiON, Ta2O5, Al2O3, polyimide, BCB, PBO, orother material having suitable insulating and structural properties,especially polymer photo sensitive dielectric materials. A portion ofinsulating layer 154 is removed to expose conductive layer 152.

In FIG. 3i , an optional electrically conductive layer 156 is formedover conductive layer 152 c using PVD, CVD, sputtering, electrolyticplating, electroless plating process, or other suitable metal depositionprocess. Conductive layer 156 can be one or more layers of Ti, TiW, NiV,Cr, CrCu, Al, Cu, Sn, Ni, Au, Ag, or other suitable electricallyconductive material. In one embodiment, conductive layer 156 is an underbump metallization (UBM) containing a multi-layer metal stack with anadhesion layer, barrier layer, and seed or wetting layer. The adhesionlayer is formed over conductive layer 152 c and can be Ti, TiN, TiW, Al,or chromium (Cr). The barrier layer is formed over the adhesion layerand can be Ni, nickel vanadium (NiV), platinum (Pt), palladium (Pd),TiW, or chromium copper (CrCu). The barrier layer inhibits the diffusionof Cu into the active area of the die. The seed layer can be Cu, Ni,NiV, Au, or Al. The seed layer is formed over the barrier layer and actsas an intermediate conductive layer between conductive layer 152 c andsubsequent solder bumps or other interconnect structure. UBM 156provides a low resistive interconnect to conductive layer 152 c, as wellas a barrier to solder diffusion and seed layer for solder wettability.

An electrically conductive bump material is deposited over UBM 156 usingan evaporation, electrolytic plating, electroless plating, ball drop, orscreen printing process. The bump material can be Al, Sn, Ni, Au, Ag,Pb, Bi, Cu, solder, and combinations thereof, with an optional fluxsolution. For example, the bump material can be eutectic Sn/Pb,high-lead solder, or lead-free solder. The bump material is bonded toUBM 156 using a suitable attachment or bonding process. In oneembodiment, the bump material is reflowed by heating the material aboveits melting point to form spherical balls or bumps 158. In someapplications, bumps 158 are reflowed a second time to improve electricalcontact to UBM 156. The bumps can also be compression bonded to UBM 156.Bumps 158 represent one type of interconnect structure that can beformed over UBM 156. The interconnect structure can also use bond wires,conductive paste, stud bump, micro bump, or other electricalinterconnect. For example, bond wire 160 is formed over conductive layer152 j.

The structures described in FIGS. 3c-3i constitute a plurality ofpassive circuit elements or IPDs 162. In one embodiment, conductivelayer 128 a, resistive layer 146, insulating layer 148, and conductivelayer 152 a is a metal insulator metal (MIM) capacitor. Resistive layer146 between conductive layer 152 c and 152 d is a resistor element inthe passive circuit. The individual sections of conductive layer 152d-152 i can be wound or coiled in plan-view to produce or exhibit thedesired properties of an inductor. IPD 162 can have any combination ofcapacitors, resistors, and/or inductors.

The IPD structure 162 provides electrical characteristics needed forhigh frequency applications, such as resonators, high-pass filters,low-pass filters, band-pass filters, symmetric Hi-Q resonanttransformers, matching networks, and tuning capacitors. The IPDs can beused as front-end wireless RF components, which can be positionedbetween the antenna and transceiver. The inductor can be a hi-Q balun,transformer, or coil, operating up to 100 Gigahertz. In someapplications, multiple baluns are formed over a same substrate, allowingmulti-band operation. For example, two or more baluns are used in aquad-band for mobile phones or other global system for mobile (GSM)communications, each balun dedicated for a frequency band of operationof the quad-band device. A typical RF system requires multiple IPDs andother high frequency circuits in one or more semiconductor packages toperform the necessary electrical functions. Conductive layer 152 j canbe a ground plane for the IPD structure.

The IPD structure 162 formed over polymer matrix composite substrate 134simplifies the manufacturing process and reduces cost. An optionaltemporary and reusable metal carrier is used to build the artificialmolding compound wafer or panel. The polymer matrix composite substrate134 provides high resistivity, low loss tangent, low dielectricconstant, matching CTE with the IPD structure, and good thermalconductivity.

FIGS. 4a-4e illustrate, in relation to FIGS. 1 and 2 a-2 c, anotherprocess of forming an IPD structure over a polymer matrix composite orEMC substrate. In FIG. 4a , a chase mold 170 has upper plate 170 a andlower plate 170 b. A releasable tape 172 is applied to upper plate 170 aof chase mold 170. A releasable tape 174 with optional adhesiveproperties is applied to lower plate 170 b. Tape 172 and 174 arereleasable by mechanical or thermal pressure. An encapsulant or moldingcompound 176 is dispensed into the open area between upper plate 170 aand lower plate 170 b using compressive molding, transfer molding,liquid encapsulant molding, or other suitable applicator. Encapsulant176 can be a liquid, granular, or powder form of polymer compositematerial, such as epoxy resin with filler, epoxy acrylate with filler,or polymer with proper filler from 40% up to 95% content. When cured andremoved from mold chase 170, encapsulant 176 forms a polymer matrixcomposite substrate wafer or panel 178, as shown in FIG. 4b . Thepolymer matrix composite substrate 178 has high resistivity, low losstangent, lower dielectric constant, CTE matching the overlaying IPDstructure, and good thermal conductivity. An optional insulation layer180 can be formed over polymer matrix composite substrate 178 asplanarization layer with good insulation properties.

In FIG. 4c , an electrically conductive layer 182 is formed overinterface and insulation layer 180 on substrate 178 using patterningwith PVD, CVD, sputtering, electrolytic plating, electroless platingprocess, or other suitable metal deposition process to form individualportions or sections 182 a-182 c. Conductive layer 182 can be one ormore layers of Al, Cu, Sn, Ni, Au, Ag, Ti, TiW, TiN, or other suitableelectrically conductive material, with Ti, TiN, or TiW as an adhesive orbarrier layer. The individual portions of conductive layer 182 can beelectrically common or electrically isolated depending on theconnectivity of the individual semiconductor die.

An optional resistive layer 184 is formed over conductive layer 182 aand interface layer 180 of substrate 178 using PVD, CVD, or othersuitable deposition process. In one embodiment, resistive layer 184 canbe TaxSiy or other metal silicides, TaN, NiCr, Ti, TiN, TiW, or dopedpoly-silicon having a resistivity between 5 and 100 ohm/sq.

An insulating or dielectric layer 186 is formed over resistive layer 184using patterning with PVD, CVD, printing, sintering, or thermaloxidation. The insulating layer 186 can be one or more layers of SiO2,Si3N4, SiON, Ta2O5, Al2O3, polyimide, BCB, PBO, or other suitabledielectric material.

An insulating or passivation layer 188 is formed over conductive layer182, resistive layer 184, and insulating layer 186 using spin coating,PVD, CVD, printing, sintering, or thermal oxidation. The insulatinglayer 188 can be one or more layers of SiO2, Si3N4, SiON, Ta2O5, Al2O3,polyimide, BCB, PBO, WPR, or other material having suitable insulatingand structural properties, especially polymer photo sensitive dielectricmaterials. A portion of insulating layer 188 is removed to exposeconductive layer 182, resistive layer 184, and insulating layer 186.

In FIG. 4d , an electrically conductive layer 190 is formed overconductive layer 182, insulating layers 186 and 188, and resistive layer184 using patterning with PVD, CVD, sputtering, electrolytic plating,electroless plating process, or other suitable metal deposition processto form individual portions or sections 190 a-190 j. Conductive layer190 can be one or more layers of Al, Cu, Sn, Ni, Au, Ag, Ti, TiW, TiN,or other suitable electrically conductive material, with Ti, TiN, or TiWas an adhesive or barrier layer. The individual portions of conductivelayer 190 a-190 j can be electrically common or electrically isolateddepending on the connectivity of the individual semiconductor die.

An insulating or passivation layer 192 is formed over insulating layer188 and conductive layer 190 using spin coating, PVD, CVD, printing,sintering, or thermal oxidation. The insulating layer 192 can be one ormore layers of SiO2, Si3N4, SiON, Ta2O5, Al2O3, polyimide, BCB, PBO,WPR, or other material having suitable insulating and structuralproperties, especially polymer photo sensitive dielectric materials. Aportion of insulating layer 192 is removed to expose conductive layer190.

In FIG. 4e , an electrically conductive layer 194 is formed overconductive layer 190 c using PVD, CVD, sputtering, electrolytic plating,electroless plating process, or other suitable metal deposition process.Conductive layer 194 can be one or more layers of Ti, TiW, NiV, Cr,CrCu, Al, Cu, Sn, Ni, Au, Ag, or other suitable electrically conductivematerial. In one embodiment, conductive layer 194 is a UBM containing amulti-layer metal stack with an adhesion layer, barrier layer, and seedor wetting layer. The adhesion layer is formed over conductive layer 190c and can be Ti, TiN, TiW, Al, or Cr. The barrier layer is formed overthe adhesion layer and can be Ni, NiV, Pt, Pd, TiW, or CrCu. The barrierlayer inhibits the diffusion of Cu into the active area of the die. Theseed layer can be Cu, Ni, NiV, Au, or Al. The seed layer is formed overthe barrier layer and acts as an intermediate conductive layer betweenconductive layer 190 c and subsequent solder bumps or other interconnectstructure. UBM 194 provides a low resistive interconnect to conductivelayer 190 c, as well as a barrier to solder diffusion and seed layer forsolder wettability.

An electrically conductive bump material is deposited over UBM 194 usingan evaporation, electrolytic plating, electroless plating, ball drop, orscreen printing process. The bump material can be Al, Sn, Ni, Au, Ag,Pb, Bi, Cu, solder, and combinations thereof, with an optional fluxsolution. For example, the bump material can be eutectic Sn/Pb,high-lead solder, or lead-free solder. The bump material is bonded toUBM 194 using a suitable attachment or bonding process. In oneembodiment, the bump material is reflowed by heating the material aboveits melting point to form spherical balls or bumps 196. In someapplications, bumps 196 are reflowed a second time to improve electricalcontact to UBM 194. The bumps can also be compression bonded to UBM 194.Bumps 196 represent one type of interconnect structure that can beformed over UBM 194. The interconnect structure can also use bond wires,conductive paste, stud bump, micro bump, or other electricalinterconnect. For example, bond wire 198 is formed over conductive layer190 j.

The structures described in FIGS. 4b-4e constitute a plurality ofpassive circuit elements or IPDs 200. In one embodiment, conductivelayer 182 a, resistive layer 184, insulating layer 186, and conductivelayer 190 a is a MIM capacitor. Resistive layer 184 between conductivelayer 190 c and 190 d is a resistor element in the passive circuit. Theindividual sections of conductive layer 190 d-190 i can be wound orcoiled in plan-view to produce or exhibit the desired properties of aninductor. IPD 200 can have any combination of capacitors, resistors,and/or inductors.

The IPD structure 200 provides electrical characteristics needed forhigh frequency applications, such as resonators, high-pass filters,low-pass filters, band-pass filters, symmetric Hi-Q resonanttransformers, matching networks, and tuning capacitors. The IPDs can beused as front-end wireless RF components, which can be positionedbetween the antenna and transceiver. The inductor can be a hi-Q balun,transformer, or coil, operating up to 100 Gigahertz. In someapplications, multiple baluns are formed over a same substrate, allowingmulti-band operation. For example, two or more baluns are used in aquad-band for mobile phones or other GSM communications, each balundedicated for a frequency band of operation of the quad-band device. Atypical RF system requires multiple IPDs and other high frequencycircuits in one or more semiconductor packages to perform the necessaryelectrical functions. Conductive layer 190 j can be a ground plane forthe IPD structure. The IPD structure 200 formed over polymer matrixcomposite substrate 178 simplifies the manufacturing process and reducescost. The polymer matrix composite substrate 178 provides highresistivity, low loss tangent, low dielectric constant, matching CTEwith the IPD structure, and good thermal conductivity.

FIG. 5 illustrates another IPD structure formed over a polymer matrixcomposite substrate. Using a chase mold, a polymer matrix compositesubstrate wafer or panel 210 is formed in a similar manner as FIG. 4a .The polymer matrix composite substrate 210 has high resistivity, lowloss tangent, lower dielectric constant, CTE matching the overlaying IPDstructure, and good thermal conductivity.

An electrically conductive layer 212 is formed over substrate 210 usingpatterning with PVD, CVD, sputtering, electrolytic plating, electrolessplating process, or other suitable metal deposition process to formindividual portions or sections 212 a-212 c. Conductive layer 212 can beone or more layers of Al, Cu, Sn, Ni, Au, Ag, Ti, TiN, TiW, or othersuitable electrically conductive material, with Ti, TiN, or TiW as anadhesive or barrier layer. The individual portions of conductive layer212 can be electrically common or electrically isolated depending on theconnectivity of the individual semiconductor die.

An insulating or passivation layer 218 is formed over conductive layer212 using spin coating, PVD, CVD, printing, sintering, or thermaloxidation. The insulating layer 218 can be one or more layers of SiO2,Si3N4, SiON, Ta2O5, Al2O3, polyimide, BCB, PBO, WPR, or other materialhaving suitable insulating and structural properties, especially polymerphoto sensitive dielectric materials. A portion of insulating layer 218is removed to expose conductive layer 212.

An electrically conductive layer 220 is formed over insulating layer 218using patterning with PVD, CVD, sputtering, electrolytic plating,electroless plating process, or other suitable metal deposition process.Conductive layer 220 is an adhesion layer or barrier layer, such as Ti,TiW, TiN, TaxSiy, and TaN. Conductive layer 220 operates as a resistivelayer for the IPD structure.

An electrically conductive layer 222 is formed over conductive layer 220using patterning with PVD, CVD, sputtering, electrolytic plating,electroless plating process, or other suitable metal deposition processto form individual portions or sections 222 a-222 j. Conductive layer222 can be one or more layers of Al, Cu, Sn, Ni, Au, Ag, or othersuitable electrically conductive material. The individual portions ofconductive layer 222 a-222 j are electrically common or electricallyisolated depending on the connectivity of the individual semiconductordie.

An insulating or passivation layer 224 is formed over insulating layer218 and conductive layers 220 and 222 using spin coating, PVD, CVD,printing, sintering, or thermal oxidation. The insulating layer 224 canbe one or more layers of SiO2, Si3N4, SiON, Ta2O5, Al2O3, polyimide,BCB, PBO, WPR, or other material having suitable insulating andstructural properties, especially polymer photo sensitive dielectricmaterials. A portion of insulating layer 224 is removed to exposeconductive layer 222.

An electrically conductive layer 226 is formed over conductive layer 222c using PVD, CVD, sputtering, electrolytic plating, electroless platingprocess, or other suitable metal deposition process. Conductive layer226 can be one or more layers of Al, Cu, Sn, Ni, Au, Ag, or othersuitable electrically conductive material. In one embodiment, conductivelayer 226 is a UBM containing a multi-layer metal stack with an adhesionlayer, barrier layer, and seed or wetting layer. The adhesion layer isformed over conductive layer 222 c and can be Ti, TiN, TiW, Al, or Cr.The barrier layer is formed over the adhesion layer and can be Ni, NiV,Pt, Pd, TiW, or CrCu. The barrier layer inhibits the diffusion of Cuinto the active area of the die. The seed layer can be Cu, Ni, NiV, Au,or Al. The seed layer is formed over the barrier layer and acts as anintermediate conductive layer between conductive layer 222 c andsubsequent solder bumps or other interconnect structure. UBM 226provides a low resistive interconnect to conductive layer 222 c, as wellas a barrier to solder diffusion and seed layer for solder wettability.

An electrically conductive bump material is deposited over UBM 226 usingan evaporation, electrolytic plating, electroless plating, ball drop, orscreen printing process. The bump material can be Al, Sn, Ni, Au, Ag,Pb, Bi, Cu, solder, and combinations thereof, with an optional fluxsolution. For example, the bump material can be eutectic Sn/Pb,high-lead solder, or lead-free solder. The bump material is bonded toUBM 226 using a suitable attachment or bonding process. In oneembodiment, the bump material is reflowed by heating the material aboveits melting point to form spherical balls or bumps 228. In someapplications, bumps 228 are reflowed a second time to improve electricalcontact to UBM 226. The bumps can also be compression bonded toconductive layer 226. Bumps 228 represent one type of interconnectstructure that can be formed over UBM 226. The interconnect structurecan also use bond wires, conductive paste, stud bump, micro bump, orother electrical interconnect. For example, bond wire 230 is formed overconductive layer 222 j.

The structures described in FIG. 5 constitute a plurality of passivecircuit elements or IPDs 232. In one embodiment, conductive layer 212 a,insulating layer 218, conductive layer 220, and conductive layer 222 ais a MIM capacitor. The individual sections of conductive layer 222d-222 i can be wound or coiled in plan-view to produce or exhibit thedesired properties of an inductor. IPD 232 can have any combination ofcapacitors, resistors, and/or inductors.

The IPD structure 232 provides electrical characteristics needed forhigh frequency applications, such as resonators, high-pass filters,low-pass filters, band-pass filters, symmetric Hi-Q resonanttransformers, matching networks, and tuning capacitors. The IPDs can beused as front-end wireless RF components, which can be positionedbetween the antenna and transceiver. The inductor can be a hi-Q balun,transformer, or coil, operating up to 100 Gigahertz. In someapplications, multiple baluns are formed over a same substrate, allowingmulti-band operation. For example, two or more baluns are used in aquad-band for mobile phones or other GSM communications, each balundedicated for a frequency band of operation of the quad-band device. Atypical RF system requires multiple IPDs and other high frequencycircuits in one or more semiconductor packages to perform the necessaryelectrical functions. Conductive layer 190 j can be a ground plane forthe IPD structure.

The IPD structure 232 formed over polymer matrix composite substrate 210simplifies the manufacturing process and reduces cost. The polymermatrix composite substrate 210 provides high resistivity, low losstangent, low dielectric constant, matching CTE with the IPD structure,and good thermal conductivity.

FIG. 6 shows an exemplary inductor 242 formed with conductive layer 222.

FIGS. 7a-7n illustrate, in relation to FIGS. 1 and 2 a-2 c, a process offorming an inductor over a polymer matrix composite substrate. In FIG.7a , a chase mold 250 has upper plate 250 a and lower plate 250 b. Anoptional releasable tape 252 is applied to upper plate 250 a of chasemold 250. An optional metal carrier 254 is mounted to lower plate 250 b.Carrier 254 can also be silicon, polymer, polymer composite, ceramic,glass, glass epoxy, beryllium oxide, tape, or other suitable low-cost,rigid material for structural support. Carrier 254 can be reusable inthe manufacturing process. A releasable adhesive tape 256 is applied tocarrier 254. Tape 252 and 256 are releasable by mechanical or thermalpressure.

In FIG. 7b , an encapsulant material or molding compound 260 isdispensed into the open area between upper plate 250 a and lower plate250 b, using compressive molding, transfer molding, liquid encapsulantmolding, or other suitable applicator. Encapsulant 260 can be a liquid,granular, or powder form of polymer composite material, such as epoxyresin with filler, epoxy acrylate with filler, or polymer with properfiller from 40% up to 95% content. When cured and removed from moldchase 250, encapsulant 260 forms a polymer matrix composite substratewafer or panel 264, such as an EMC substrate, as shown in FIG. 7 c.

FIG. 7d shows another method of forming the polymer matrix compositesubstrate. Chase mold 266 has upper plate 266 a and lower plate 266 b.An optional releasable tape 268 with adhesive layer is applied to upperplate 266 a of chase mold 266. An optional releasable tape 270 withadhesive layer is applied to lower plate 266 b. Tape 268 and 270 arereleasable by mechanical or thermal pressure. An encapsulant or moldingcompound 272 is dispensed into the open area between upper plate 266 aand lower plate 266 b using compressive molding, transfer molding,liquid encapsulant molding, or other suitable applicator. Encapsulant272 can be a liquid, granular, or powder form of polymer compositematerial, such as epoxy resin with filler, epoxy acrylate with filler,or polymer with proper filler from 40% up to 95% content. When cured andremoved from mold chase 266, encapsulant 272 forms a polymer matrixcomposite substrate wafer or panel 274, such as an EMC substrate, asshown in FIG. 7e . The polymer matrix composite substrate 264 and 274each have high resistivity, low loss tangent, lower dielectric constant,CTE matching the overlaying IPD structure, and good thermalconductivity.

In FIG. 7f , a blanket insulating or passivation layer 276 is formedover a top surface of polymer matrix composite substrate 274 (or polymermatrix composite substrate 264) using spin coating, PVD, CVD, printing,sintering, or thermal oxidation. The insulating layer 276 can be one ormore layers of SiO2, Si3N4, SiON, Ta2O5, Al2O3, polyimide, BCB, PBO,WPR, or other material having suitable insulating and structuralproperties. Alternatively, insulating layer 276 is formed during themolding process in chase mold 250 or 266 with the interaction betweenthe encapsulant and releasing tape.

FIG. 7g shows an alternate embodiment with the blanket insulating layer276 formed over the top surface of polymer matrix composite substrate274. In addition, a blanket insulating or passivation layer 278 isformed over a bottom surface of polymer matrix composite substrate 274,opposite the top surface using spin coating, lamination, PVD, CVD,printing, sintering, or thermal oxidation. The insulating layer 278 canbe one or more layers of SiO2, Si3N4, SiON, Ta2O5, Al2O3, polyimide,BCB, PBO, WPR, or other material having suitable insulating andstructural properties. Alternatively, insulating layers 276 and 278 areformed during the molding process in chase mold 250 or 266 with theinteraction between the encapsulant and releasing tape. The insulatinglayers 276 and 278 can be the same materials with the same or differentthickness.

FIG. 7h shows an embodiment with the blanket insulating layer 276 formedover the top surface of polymer matrix composite substrate 274, and ablanket insulating or passivation layer 280 formed over insulating layer276, using spin coating, PVD, CVD, printing, sintering, or thermaloxidation. The insulating layer 280 can be one or more layers of SiO2,Si3N4, SiON, Ta2O5, Al2O3, polyimide, BCB, PBO, or other material havingsuitable insulating and structural properties. The insulating layer 276can be formed during the molding process in chase mold 250 or 266.

FIG. 7i shows an embodiment without an insulating layer over either thetop surface or bottom surface of polymer matrix composite substrate 274.

Continuing with the embodiment of FIG. 7f , an electrically conductivelayer 282 is formed over insulating layer 276 using patterning with PVD,CVD, sputtering, electrolytic plating, electroless plating process, orother suitable metal deposition process to form individual portions orsections 282 a-282 c, as shown in FIG. 7j . Conductive layer 282 can beone or more layers of Al, Cu, Sn, Ni, Au, Ag, Ti, TiN, TiW, or othersuitable electrically conductive material, with Ti, TiN, or TiW as anadhesive or barrier layer. The individual portions of conductive layer282 a-282 c can be electrically common or electrically isolateddepending on the connectivity of the individual semiconductor die.Although conductive layer 282 is shown over insulating layer 276 fromFIG. 7f , the conductive layer can be similarly formed over theinsulating layers and/or polymer matrix composite substrate 274 in theembodiments of FIGS. 7g -7 i.

In FIG. 7k , an insulating or passivation layer 284 is formed overinsulating layer 276 and conductive layer 282 using spin coating, PVD,CVD, printing, sintering, or thermal oxidation. The insulating layer 284can be one or more layers of SiO2, Si3N4, SiON, Ta2O5, Al2O3, polyimide,BCB, PBO, WPR, or other material having suitable insulating andstructural properties, especially polymer photo sensitive dielectricmaterials. The insulating layer 284 serves in part to planarize thesurface of polymer matrix composite substrate 274 in part to improvestep coverage of subsequent deposition and lithography processing steps.

In FIG. 7l , an electrically conductive layer 286 is formed overconductive layer 282 a-282 c and insulating layer 284 using patterningwith PVD, CVD, sputtering, electrolytic plating, electroless platingprocess, or other suitable metal deposition process. Conductive layer286 can be one or more layers of Al, Cu, Sn, Ni, Au, Ag, Ti, TiW, orother suitable electrically conductive material. Conductive layer 286 isan adhesion layer or barrier layer. The adhesion layer can be Ti, TiN,TiW, Al, or Cr. The barrier layer can be Ni, NiV, Pt, Pd, TiW, or CrCu.The barrier layer inhibits the diffusion of Cu into the active area ofthe die.

An electrically conductive layer 288 is formed over conductive layer 286using patterning with PVD, CVD, sputtering, electrolytic plating,electroless plating process, or other suitable metal deposition processto form individual portions or sections 288 a-288 j. Conductive layer288 can be one or more layers of Al, Cu, Sn, Ni, Au, Ag, or othersuitable electrically conductive material. The individual portions ofconductive layer 288 a-288 j are electrically common or electricallyisolated depending on the connectivity of the individual semiconductordie.

In FIG. 7m , an insulating or passivation layer 292 is formed overinsulating layer 284 and conductive layer 288 using spin coating, PVD,CVD, printing, sintering, or thermal oxidation. The insulating layer 292can be one or more layers of SiO2, Si3N4, SiON, Ta2O5, Al2O3, polyimide,BCB, PBO, WPR, or other material having suitable insulating andstructural properties, especially polymer photo sensitive dielectricmaterials. A portion of insulating layer 292 is removed to exposeconductive layer 288 c and 288 j.

In FIG. 7n , an electrically conductive layer 294 formed over conductivelayer 288 c and 288 j as a UBM containing a multi-layer metal stack withan adhesion layer, barrier layer, and seed or wetting layer. Theadhesion layer can be Ti, TiN, TiW, Al, or Cr. The barrier layer can beNi, NiV, Pt, Pd, TiW, or CrCu. The barrier layer inhibits the diffusionof Cu into the active area of the die. The seed layer can be Cu, Ni,NiV, Au, or Al. The seed layer is formed over the barrier layer and actsas an intermediate conductive layer between conductive layer 288 c and288 j and subsequent solder bumps or other interconnect structure. UBM294 provides a low resistive interconnect to conductive layer 288 c and288 j, as well as a barrier to solder diffusion and seed layer forsolder wettability. Alternatively, conductive layer 294 can overlap theedge of the via in insulating layer 292.

An electrically conductive bump material is deposited over UBM 294 usingan evaporation, electrolytic plating, electroless plating, ball drop, orscreen printing process. The bump material can be Al, Sn, Ni, Au, Ag,Pb, Bi, Cu, solder, and combinations thereof, with an optional fluxsolution. For example, the bump material can be eutectic Sn/Pb,high-lead solder, or lead-free solder. The bump material is bonded toUBM 294 using a suitable attachment or bonding process. In oneembodiment, the bump material is reflowed by heating the material aboveits melting point to form spherical balls or bumps 296. In someapplications, bumps 296 are reflowed a second time to improve electricalcontact to UBM 294. The bumps can also be compression bonded to UBM 294.Bumps 296 represent one type of interconnect structure that can beformed over UBM 294. The interconnect structure can also use bond wires,conductive paste, stud bump, micro bump, or other electricalinterconnect.

The structure described in FIG. 7a-7n , more specifically conductivelayer 288 e-288 i, constitutes an inductor formed over polymer matrixcomposite substrate 274. The individual sections of conductive layer 288e-288 i can be wound or coiled in plan-view to produce or exhibit thedesired properties of an inductor. The inductor structure 288 e-288 iprovides electrical characteristics needed for high frequencyapplications, such as resonators, high-pass filters, low-pass filters,band-pass filters, symmetric Hi-Q resonant transformers, matchingnetworks, and tuning capacitors. The inductor can be used as front-endwireless RF components, which can be positioned between the antenna andtransceiver. The inductor can be a hi-Q balun, transformer, or coil,operating up to 100 Gigahertz. In some applications, multiple baluns areformed over a same substrate, allowing multi-band operation. Forexample, two or more baluns are used in a quad-band for mobile phones orother GSM communications, each balun dedicated for a frequency band ofoperation of the quad-band device. A typical RF system requires multipleinductors and other high frequency circuits in one or more semiconductorpackages to perform the necessary electrical functions.

The inductor structure 288 e-288 i formed over polymer matrix compositesubstrate 274 simplifies the manufacturing process and reduces cost. Anoptional temporary and reusable metal carrier is used to build theartificial molding compound wafer or panel. The polymer matrix compositesubstrate 274 provides high resistivity, low loss tangent, lowdielectric constant, matching CTE with the IPD structure, and goodthermal conductivity.

While one or more embodiments of the present invention have beenillustrated in detail, the skilled artisan will appreciate thatmodifications and adaptations to those embodiments may be made withoutdeparting from the scope of the present invention as set forth in thefollowing claims.

What is claimed:
 1. A semiconductor device, comprising: a polymer matrixcomposite substrate; a first insulating layer completely covering asurface of the polymer matrix composite substrate; an inductor formedover the first insulating layer; and an interconnect structure formedover the inductor and first insulating layer and configured toelectrically and mechanically connect the semiconductor device to asecond substrate.
 2. The semiconductor device of claim 1, furtherincluding a capacitor formed over the polymer matrix compositesubstrate, the capacitor including, a first conductive layer formed overthe polymer matrix composite substrate; a second insulating layer formedover the first conductive layer; and a second conductive layer formedover the second insulating layer.
 3. The semiconductor device of claim2, further including a third insulating layer formed over the secondinsulating layer.
 4. The semiconductor device of claim 1, furtherincluding a second insulating layer formed over the first insulatinglayer and inductor.
 5. The semiconductor device of claim 1, wherein theinterconnect structure includes a bump.
 6. The semiconductor device ofclaim 1, further including a resistive layer formed over the polymermatrix composite substrate.
 7. A semiconductor device, comprising: apolymer matrix composite substrate; a first insulating layer formed overthe polymer matrix composite substrate; an integrated passive deviceformed over the first insulating layer; and an interconnect structureformed over the first insulating layer to couple the integrated passivedevice to a second substrate.
 8. The semiconductor device of claim 7,wherein the integrated passive device includes an inductor.
 9. Thesemiconductor device of claim 7, wherein the integrated passive deviceincludes a capacitor comprising, a first conductive layer formed overthe polymer matrix composite substrate; a second insulating layer formedover the first conductive layer; and a second conductive layer formedover the second insulating layer.
 10. The semiconductor device of claim7, wherein the interconnect structure includes a bump.
 11. Thesemiconductor device of claim 7, further including a resistive layerformed over the polymer matrix composite substrate.
 12. Thesemiconductor device of claim 7, further including a second insulatinglayer formed over the first insulating layer and integrated passivedevice.
 13. The semiconductor device of claim 7, wherein a coefficientof thermal expansion of the polymer matrix composite substrate matches acoefficient of thermal expansion of the integrated passive device.
 14. Asemiconductor device, comprising: a polymer matrix composite substrate;an integrated passive device formed over the polymer matrix compositesubstrate; and an interconnect structure formed over the integratedpassive device and configured to attach the semiconductor device to asecond substrate.
 15. The semiconductor device of claim 14, wherein theintegrated passive device includes an inductor.
 16. The semiconductordevice of claim 14, wherein the integrated passive device includes acapacitor comprising, a first conductive layer formed over the polymermatrix composite substrate; an insulating layer formed over the firstconductive layer; and a second conductive layer formed over theinsulating layer.
 17. The semiconductor device of claim 14, wherein theinterconnect structure includes a bump.
 18. The semiconductor device ofclaim 14, further including a resistive layer formed over the polymermatrix composite substrate.
 19. The semiconductor device of claim 14,further including: a first insulating layer formed over the polymermatrix composite substrate; and a second insulating layer formed overthe first insulating layer and integrated passive device.
 20. Thesemiconductor device of claim 14, wherein a coefficient of thermalexpansion of the polymer matrix composite substrate matches acoefficient of thermal expansion of the integrated passive device.
 21. Asemiconductor device, comprising: a polymer matrix composite substrate;an integrated passive device formed over the polymer matrix compositesubstrate; and an interconnect structure disposed over the integratedpassive device to couple the integrated passive device to a secondsubstrate.
 22. The semiconductor device of claim 21, wherein theinterconnect structure includes a bump.
 23. The semiconductor device ofclaim 22, further including a printed circuit board, wherein the bump isbonded to the printed circuit board.
 24. The semiconductor device ofclaim 21, wherein a coefficient of thermal expansion of the polymermatrix composite substrate matches a coefficient of thermal expansion ofthe integrated passive device.